Title :
Effect of Electrical Grounding on Electron Irradiation of PbSnTe/PbTe Heterostructures
Author_Institution :
Naval Surface Weapons Center White Oad, Silver Spring, MD 20910
fDate :
6/1/1978 12:00:00 AM
Keywords :
Capacitance; Circuits; Degradation; Detectors; Electric variables measurement; Electronics packaging; Electrons; Glass; Grounding; Lead;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1978.4329459
