DocumentCode
834103
Title
Shapeme histogram projection and matching for partial object recognition
Author
Shan, Ying ; Sawhney, Harpreet S. ; Matei, Bogdan ; Kumar, Rakesh
Author_Institution
Vision Technol. Lab., Sarnoff Corp., Princeton, NJ, USA
Volume
28
Issue
4
fYear
2006
fDate
4/1/2006 12:00:00 AM
Firstpage
568
Lastpage
577
Abstract
Histograms of shape signature or prototypical shapes, called shapemes, have been used effectively in previous work for 2D/3D shape matching and recognition. We extend the idea of shapeme histogram to recognize partially observed query objects from a database of complete model objects. We propose representing each model object as a collection of shapeme histograms and match the query histogram to this representation in two steps: 1) compute a constrained projection of the query histogram onto the subspace spanned by all the shapeme histograms of the model and 2) compute a match measure between the query histogram and the projection. The first step is formulated as a constrained optimization problem that is solved by a sampling algorithm. The second step is formulated under a Bayesian framework, where an implicit feature selection process is conducted to improve the discrimination capability of shapeme histograms. Results of matching partially viewed range objects with a 243 model database demonstrate better performance than the original shapeme histogram matching algorithm and other approaches.
Keywords
Bayes methods; feature extraction; object recognition; optimisation; sampling methods; Bayesian analysis; complete model objects; constrained optimization problem; implicit feature selection process; match measure computation; partial object recognition; partially observed query objects; prototypical shapes; query histogram constrained projection; sampling algorithm; shape signature; shapeme histogram projection; Bayesian methods; Constraint optimization; Histograms; Layout; Object recognition; Prototypes; Sampling methods; Shape measurement; Spatial databases; Subspace constraints; Bayesian analysis.; Gibbs sampling; Shapeme histogram; feature saliency; object recognition; spin image; Algorithms; Artificial Intelligence; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Models, Biological; Models, Statistical; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2006.83
Filename
1597114
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