DocumentCode :
834242
Title :
A 14-bit 80-kHz sigma-delta A/D converter: modeling, design and performance evaluation
Author :
Norsworthy, Steven R. ; Post, Irving G. ; Fetterman, H. Scott
Author_Institution :
AT&T Bell Lab., Allentown, PA, USA
Volume :
24
Issue :
2
fYear :
1989
fDate :
4/1/1989 12:00:00 AM
Firstpage :
256
Lastpage :
266
Abstract :
The development is described of a sigma-delta A/D (analog-to-digital) converter. Included is a brief overview of sigma-delta conversion. The A/D converter achieves an 88.5-dB dynamic range and a maximum signal-to-noise ratio of 81.5 dB. The harmonic distortion is negligible. This level of performance is about 10 dB higher than previously reported results for oversampled A/D converters in this frequency range. The analog modulator uses a double-integration switched-capacitor architecture with an oversampling rate of 10.24 MHz. Transconductance amplifiers having a 160-MHz f/sub t/ were developed for the integrators. The circuit is implemented in a 1.75- mu m 5-V CMOS process. The analog circuitry occupies 2 mm/sup 2/ of silicon area and consumes 75 mW of power. Some of the difficult problems associated with evaluating the performance of sigma-delta converters are described. The design of a sigma-delta development and performance evaluation system is presented. This system includes a custom interface board linking the chip to a Sun workstation, and extensive digital signal processing and analysis software.<>
Keywords :
CMOS integrated circuits; analogue-digital conversion; 1.75 micron; 10.24 MHz; 5 V; 75 mW; 80 kHz; 81.5 dB; CMOS; Sun workstation; analog circuitry; analog modulator; custom interface board; design; digital signal processing; double-integration switched-capacitor architecture; dynamic range; harmonic distortion; modeling; oversampled A/D converters; oversampling rate; performance evaluation; performance evaluation system; sigma delta ADC; sigma-delta conversion; sigma-delta converters; signal-to-noise ratio; transconductance amplifiers; Analog-digital conversion; CMOS process; Circuits; Delta-sigma modulation; Dynamic range; Frequency conversion; Harmonic distortion; Signal to noise ratio; Silicon; Transconductance;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.18584
Filename :
18584
Link To Document :
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