DocumentCode :
834833
Title :
Flexible cryo-packages for Josephson devices
Author :
Burroughs, Charles J. ; Benz, Samuel P. ; Dresselhaus, Paul D. ; Chong, Yonuk ; Yamamori, Hirotake
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Volume :
15
Issue :
2
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
465
Lastpage :
468
Abstract :
We have developed a method of bonding superconductive integrated-circuit chips to interchangeable, microwave-compatible, flexible cryo-packages. This "flip-chip on flex" technology will greatly improve the service life and reliability of our Josephson systems because the present press-contacts to the chip are replaced with directly soldered connections. The new method eliminates the most common failure mode for our Josephson chips, which has been the degradation and variation of the contact resistances of the chip pads due to mechanical wear upon repeated thermal cycles from 4°K to room temperature. The superior microwave properties of this packaging provide improved operating margins for our devices. We have demonstrated the reliability of the bonds with repeated thermal cycling for 100% operational chips with 40 connections (67 410 Josephson junctions).
Keywords :
cryogenic electronics; flip-chip devices; integrated circuit bonding; superconducting device reliability; superconducting integrated circuits; Josephson chips; Josephson devices; Josephson junctions; contact resistances; flexible cryo-packages; flip-chip on flex technology; integrated circuit bonding; interchangeable cryo-packages; microwave properties; microwave-compatible cryo-packages; superconductive integrated-circuit chips; Bonding; Josephson junctions; Microwave theory and techniques; Packaging; Superconducting devices; Superconducting microwave devices; Superconductivity; Temperature; Thermal degradation; Thermal resistance; Chip bonding; Josephson arrays; Josephson voltage standard; cryo-packaging;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2005.849876
Filename :
1439675
Link To Document :
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