DocumentCode
834856
Title
Analysis of strain-induced polarisation-insensitive integrated waveguides fabricated using ion-implantation-induced intermixing
Author
Djie, H.S. ; Ng, S.L. ; Gunawan, O. ; Dowd, P. ; Aimez, V. ; Beauvais, J. ; Beerens, J.
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Volume
149
Issue
4
fYear
2002
fDate
8/1/2002 12:00:00 AM
Firstpage
138
Lastpage
144
Abstract
The interdiffusion effect on the strain build-up and refractive index profile of lattice-matched InGaAs/InGaAsP multiple quantum wells is reported. Interdiffusion is achieved experimentally using low energy (360 keV) arsenic or phosphorus ion-implantation-induced disordering, followed by an annealing step. A model of the interdiffusion process has been developed to analyse the effect of different interdiffusion ratios on the waveguide´s polarisation behaviour through the strain build-up and the refractive index profiles for the transverse electric and transverse magnetic modes. Polarisation-resolved photocurrent absorption measurements of quantum-well waveguide structures have shown that sufficiently high ion implantation doses can lead to the realisation of polarisation-insensitive waveguides at 1.55 μm wavelength operation. Comparison with the modelling results shows that the polarisation-dependent behaviour of the waveguides is best described by a higher interdiffusion ratio for the group V than for the group III atoms
Keywords
III-V semiconductors; chemical interdiffusion; gallium arsenide; gallium compounds; indium compounds; integrated optics; ion implantation; light polarisation; optical communication equipment; optical fabrication; optical waveguides; semiconductor quantum wells; 1.55 micron; 360 keV; As; InGaAs-InGaAsP; InGaAs/InGaAsP multiple quantum wells; P; annealing step; higher interdiffusion ratio; interdiffusion effect; interdiffusion ratios; ion-implantation-induced intermixing; lattice matched multiple quantum wells; low energy arsenic ion-implantation-induced disordering; low energy phosphorus ion-implantation-induced disordering; polarisation-resolved photocurrent absorption measurements; refractive index profile; strain build-up; strain-induced polarisation-insensitive integrated waveguides fabrication; transverse magnetic modes;
fLanguage
English
Journal_Title
Optoelectronics, IEE Proceedings -
Publisher
iet
ISSN
1350-2433
Type
jour
DOI
10.1049/ip-opt:20020528
Filename
1039380
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