DocumentCode :
83487
Title :
The Influence of Absorber Thickness on Cu(In,Ga)Se _{\\bf 2} Solar Cells With Different Buffer Layers
Author :
Pettersson, Jonas ; Torndahl, T. ; Platzer-Bjorkman, Charlotte ; Hultqvist, A. ; Edoff, M.
Author_Institution :
Ångstrom Solar Center, Uppsala Univ., Uppsala, Sweden
Volume :
3
Issue :
4
fYear :
2013
fDate :
Oct. 2013
Firstpage :
1376
Lastpage :
1382
Abstract :
This study investigates the interplay between the absorber layer of Cu(In,Ga)Se2 solar cells and the other layers of these devices. Cu(In,Ga)Se2 devices with absorbers of different thicknesses and different buffer layers are fabricated. Absorber layers and finished devices are characterized. Good efficiencies are obtained, also for devices of substandard thickness down to 0.3 μm. Best open-circuit voltages and fill factors are found for cells with half the standard absorber thickness, but the highest efficiencies are found for cells with the standard thickness of 1.6 μm due to their higher short-circuit current density. Cu(In,Ga)Se2 cells with Zn(O,S) buffer layers are more efficient than CdS reference devices for the same absorber thickness due to a higher short-circuit current. For cells with thin absorber layers, a part of the higher current is caused by higher quantum efficiency at long wavelengths. Electrical simulations indicate that the loss in the open-circuit voltage for the thinnest devices is due to recombination in the back contact region. The difference in long-wavelength quantum efficiency between the buffer layers is attributed to a difference in the CIGS band bending. Acceptors at the Cu(In,Ga)Se2-CdS interface are proposed as an explanation for this difference. A low-quality back contact region enhances the effect.
Keywords :
II-VI semiconductors; copper compounds; current density; gallium compounds; indium compounds; semiconductor device models; solar cells; ternary semiconductors; wide band gap semiconductors; zinc compounds; CIGS band bending; Cu(InGa)Se2; Zn(O,S) buffer layers; Zn(OS); absorber layer; absorber thickness; device layers; electrical simulations; fill factors; long-wavelength quantum efficiency; low-quality back contact region; open-circuit voltages; short-circuit current density; size 1.6 mum; solar cells; Buffer layers; Current measurement; Photonic band gap; Photovoltaic cells; Semiconductor device modeling; Thickness measurement; Photovoltaic cells; semiconductor device modeling;
fLanguage :
English
Journal_Title :
Photovoltaics, IEEE Journal of
Publisher :
ieee
ISSN :
2156-3381
Type :
jour
DOI :
10.1109/JPHOTOV.2013.2276030
Filename :
6579660
Link To Document :
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