• DocumentCode
    83508
  • Title

    Asymmetric structure with high electric–thermal conversion efficiency for nanoscale phase change memory based on three-dimensional simulation

  • Author

    Tian Lan ; Jinjie Sun ; Xiao Min Cheng ; Jiao Zhou ; Xiangshui Miao

  • Author_Institution
    Sch. of Opt. & Electron. Inf., Huazhong Univ. of Sci. & Technol., Wuhan, China
  • Volume
    10
  • Issue
    2
  • fYear
    2015
  • fDate
    2 2015
  • Firstpage
    76
  • Lastpage
    80
  • Abstract
    How to decrease the reset current is a key point for improving the performance of phase change memory (PCM). Therefore, an asymmetric structure of PCM is proposed to achieve this aim. Using ANSYS, three-dimensional finite element models were established to simulate the efficiency of electric-thermal conversion in PCM cells with an asymmetric structure and a conventional symmetric structure. Simulation results show that the peak temperature in the asymmetric cell with a feature size (FS) of 16 nm is higher than that in the conventional symmetric cell with the same FS by 37.2% when the same current pulse is applied. In an asymmetric cell, the current path and heat dissipating conditions are quite different from those in a symmetric cell, which leads to the remarkable enhancement in electric-thermal conversion efficiency. Simulation results also suggest a proper offset value in asymmetric structures, with which the efficiency of electric-thermal conversion can be further improved. If this new structure is used in fabrication, no additional cost will be incurred because the only difference between symmetric and asymmetric structures is the position of the top opening of the electrodes, indicating that the new structure is highly compatible with modern fabrication processes of PCM.
  • Keywords
    finite element analysis; phase change memories; 3D finite element model; ANSYS; asymmetric structure; current path; electric thermal conversion efficiency; heat dissipating conditions; nanoscale phase change memory; peak temperature; reset current;
  • fLanguage
    English
  • Journal_Title
    Micro & Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • DOI
    10.1049/mnl.2014.0233
  • Filename
    7051346