• DocumentCode
    835172
  • Title

    Charge Deposition Profiles near Co60 Irradiated Material Interfaces

  • Author

    Pine, V.W. ; Chadsey, W.L. ; Frederickson, A.R.

  • Author_Institution
    Radiation and Electromagnetics Division Science Applications, Inc. 8330 Old Courthouse Road, Suite 510 Vienna, Virginia 22180
  • Volume
    25
  • Issue
    6
  • fYear
    1978
  • Firstpage
    1586
  • Lastpage
    1590
  • Abstract
    Monte Carlo calculations are presented for the photo-Compton current and charge deposition profiles near interfaces between dissimilar materials irradiated by Co60 ¿ radiation. The calculations are compared with experimental measurements of charge deposition. Generally good agreement between the theory and experiment is demonstrated for six different material configurations.
  • Keywords
    Charge measurement; Current measurement; Electromagnetic forces; Electromagnetic radiation; Electrons; Materials science and technology; Monte Carlo methods; Optical collimators; Slabs; X-rays;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1978.4329577
  • Filename
    4329577
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=835172