Title :
X-Ray Dose Enhancement
Author_Institution :
Physical Sciences Group Science Applications, Inc. 8330 Old Courthouse Road, Suite 510 Vienna, Virginia 22180
Abstract :
A very simple model for the estimation of the x-ray dose enhancement at material interfaces is developed. The model is verified through comparison of estimates with Monte Carlo calculations. Additional Monte Carlo calculations are presented for dose enhancement for several conductor/polyethylene interfaces, for a gold/silicon interface with continuous x-ray spectra, and for a gold/silicon interface with a thin gold layer.
Keywords :
Cables; Conducting materials; Electron emission; Gold; Monte Carlo methods; Polyethylene; Prediction algorithms; Radiation effects; Reflection; Silicon;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1978.4329578
