Title :
Total Dose Tfsting of Several Types of MOS Microprocessors
Author_Institution :
Naval Research Laboratory Washington, D.C. 20375
Abstract :
Three types of microprocessors, the 8008, the 8080A, and the 1802, were tested in an ionizing radiation environment. Failure levels ranged from a very low 700 rads(Si) to anproximately 7000 rads(Si). With proper choice of vendor and lot screening it may be possible to meet some system requirements with off-the-shelf parts.
Keywords :
CMOS technology; Clocks; Ionizing radiation; Large scale integration; Manufacturing processes; Microprocessors; Performance evaluation; Production; Stress; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1978.4329588
