Flux-to-Voltage transfer function of the series-SQUID array with grain-boundary Josephson junctions

Author

Jeng, J.T. ; Hung, H.C. ; Lin, C.R. ; Wu, C.H. ; Chen, K.L. ; Chen, J.C. ; Yang, H.C. ; Liao, S.H. ; Horng, H.E.

Author_Institution

Inst. of Mechatronic Eng., Nat. Taipei Univ. of Technol., Taiwan

Volume

15

Issue

2

fYear

2005

fDate

6/1/2005 12:00:00 AM

Firstpage

793

Lastpage

796

Abstract

The factors affecting the flux-to-voltage transfer function of the series-SQUID array with grain-boundary Josephson junctions were investigated. By using the proposed critical-current-modulation model, it is found that the voltage swing of the series-SQUID array is suppressed greatly by the spread in critical currents of Josephson junctions. For the inductance L = 80 pH and the logarithmic average critical current 2I_ave = 20 μA of the component SQUID, the allowed spread in critical currents of Josephson junctions is 0.4I_ave to 2.2I_ave for achieving the low flux noise with the series SQUID array.

Keywords

SQUIDs; critical currents; superconducting arrays; transfer functions; 20 mA; critical curren; critical-current spread; critical-current-modulation model; flux-to-voltage transfer function; grain-boundary Josephson junctions; high-temperature superconductors; series-SQUID array; Critical current; High temperature superconductors; Inductance; Josephson junctions; Noise level; Physics; SQUID magnetometers; Superconducting device noise; Transfer functions; Voltage; Critical-current spread; Josephson junctions; SQUID; high-temperature superconductors;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2005.850063

Filename

1439757