Thermometry using thermal activation of Josephson junctions at MilliKelvin temperatures

Author

Ohki, Thomas A. ; Wulf, Michael ; Steinman, James P. ; Feldman, Marc J. ; Bocko, Mark F.

Author_Institution

Supercond. Digital Electron. laboratory, Univ. of Rochester, NY, USA

Volume

15

Issue

2

fYear

2005

fDate

6/1/2005 12:00:00 AM

Firstpage

868

Lastpage

871

Abstract

We use the thermal activation of Josephson junctions as a thermometer to investigate heat flow from a hot resistor at milliKelvin temperatures on a silicon chip used for superconducting qubit experiments. The experiments are compared to computer simulations and agree well. These results indicate that on-chip resistors can be used below a certain power level, but not above that level.

Keywords

heat measurement; heat transfer; resistance thermometers; silicon compounds; superconducting junction devices; superconducting processor circuits; temperature measurement; Josephson junctions; computer simulations; heat flow; hot resistor; milliKelvin temperatures; on-chip resistors; silicon chip; superconducting qubit experiments; thermal activation; thermometry; Circuits; High temperature superconductors; Josephson junctions; Quantum computing; Resistors; Substrates; Superconducting filters; Temperature sensors; Thermal conductivity; Thermal resistance;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2005.850089

Filename

1439776