DocumentCode
836134
Title
Enhancing Simulation Accuracy through Advanced Hazard Detection in Asynchronous Circuits
Author
Shi, Feng ; Makris, Yiorgos
Author_Institution
Skyworks Solutions, Inc., Irvine, CA
Volume
58
Issue
3
fYear
2009
fDate
3/1/2009 12:00:00 AM
Firstpage
394
Lastpage
408
Abstract
A fast and accurate simulator with elaborate hazard detection capabilities is vital for asynchronous circuits, not only for the purpose of design validation through logic simulation, but even more importantly for the purpose of test validation through fault simulation. Towards this end, we developed SPIN-SIM, a logic and fault simulator built around Eichelbergerpsilas classical hazard detection method, yet extended in various ways in order to overcome its limitations. More specifically, in order to improve simulation accuracy and hazard detection, SPIN-SIM i) employs a 13-valued algebra for which it adapts Eichelbergerpsilas method, ii) maintains partial orders of causal signal transitions through relative time-stamps, and iii) unfolds time-frames judiciously to distinguish between hazards and actual transitions. Experimental results demonstrate that, at the cost of a negligible increase in computational time over Eichelbergerpsilas method, if any at all, SPIN-SIM achieves significantly more accurate logic simulation and, by extension, drastically more efficient fault simulation. Furthermore, while the proposed method was developed and is presented for the class of speed-independent circuits, it is easily extendible to various other classes of asynchronous circuits.
Keywords
Boolean algebra; asynchronous circuits; fault simulation; logic design; logic simulation; logic testing; 13-valued algebra; Eichelbergerpsilas hazard detection method; SPIN-SIM; asynchronous circuit; causal signal transition; design validation; fault simulation; logic simulation; partial order; speed-independent circuit; test validation; Asynchronous circuits; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Electrical fault detection; Fault detection; Hazards; Logic design; Logic testing; Asynchronous Circuits; Hazard Identification; Simulation; Test generation; Testability;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.2008.141
Filename
4599573
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