• DocumentCode
    836134
  • Title

    Enhancing Simulation Accuracy through Advanced Hazard Detection in Asynchronous Circuits

  • Author

    Shi, Feng ; Makris, Yiorgos

  • Author_Institution
    Skyworks Solutions, Inc., Irvine, CA
  • Volume
    58
  • Issue
    3
  • fYear
    2009
  • fDate
    3/1/2009 12:00:00 AM
  • Firstpage
    394
  • Lastpage
    408
  • Abstract
    A fast and accurate simulator with elaborate hazard detection capabilities is vital for asynchronous circuits, not only for the purpose of design validation through logic simulation, but even more importantly for the purpose of test validation through fault simulation. Towards this end, we developed SPIN-SIM, a logic and fault simulator built around Eichelbergerpsilas classical hazard detection method, yet extended in various ways in order to overcome its limitations. More specifically, in order to improve simulation accuracy and hazard detection, SPIN-SIM i) employs a 13-valued algebra for which it adapts Eichelbergerpsilas method, ii) maintains partial orders of causal signal transitions through relative time-stamps, and iii) unfolds time-frames judiciously to distinguish between hazards and actual transitions. Experimental results demonstrate that, at the cost of a negligible increase in computational time over Eichelbergerpsilas method, if any at all, SPIN-SIM achieves significantly more accurate logic simulation and, by extension, drastically more efficient fault simulation. Furthermore, while the proposed method was developed and is presented for the class of speed-independent circuits, it is easily extendible to various other classes of asynchronous circuits.
  • Keywords
    Boolean algebra; asynchronous circuits; fault simulation; logic design; logic simulation; logic testing; 13-valued algebra; Eichelbergerpsilas hazard detection method; SPIN-SIM; asynchronous circuit; causal signal transition; design validation; fault simulation; logic simulation; partial order; speed-independent circuit; test validation; Asynchronous circuits; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Electrical fault detection; Fault detection; Hazards; Logic design; Logic testing; Asynchronous Circuits; Hazard Identification; Simulation; Test generation; Testability;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2008.141
  • Filename
    4599573