Active pixel sensors on high-resistivity silicon and their readout

Author

Chen, W. ; De Geronimo, G. ; Li, Z. ; Connor, P.O. ; Radeka, V. ; Rehak, P. ; Smith, G.C. ; Yu, B.

Author_Institution

Brookhaven Nat. Lab., Upton, NY, USA

Volume

49

Issue

3

fYear

2002

fDate

6/1/2002 12:00:00 AM

Firstpage

1006

Lastpage

1011

Abstract

The concept of X-ray active matrix pixel sensor (XAMPS) is introduced. XAMPSs are direct illumination, position sensitive X-ray detectors with the possibility of containing 1000 000 pixels. They count the number of diffracted X-rays in each pixel by measuring the total charge released by converted X-rays in the body of the sensor. Readout is accomplished with a relatively small number of channels equal to the square root of the number of pixels. The estimated readout time can be about 1 ms. Noise of the readout electronics can be so low that practically no additional fluctuations in the number of incident X-rays per pixel are added and, therefore, the XAMPS performance is very close to that of an ideal detector for X-ray crystallography.

Keywords

X-ray apparatus; X-ray crystallography; X-ray detection; nuclear electronics; position sensitive particle detectors; readout electronics; silicon radiation detectors; Si; X-ray active matrix pixel sensor; X-ray crystallography; X-ray imaging; XAMPS; active pixel sensors; estimated readout time; fluctuations; high-resistivity silicon; noise; position sensitive X-ray detectors; protein crystallography; readout electronics; silicon radiation detectors; Charge measurement; Current measurement; Fluctuations; Lighting; Matrix converters; Readout electronics; Silicon; X-ray detection; X-ray detectors; X-ray diffraction;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2002.1039605

Filename

1039605