• DocumentCode
    837204
  • Title

    Verification of timed circuits with failure-directed abstractions

  • Author

    Zheng, Hao ; Myers, Chris J. ; Walter, David ; Little, Scott ; Yoneda, Tomohiro

  • Author_Institution
    Comput. Sci. & Eng. Dept., Univ. of South Florida, Tampa, FL, USA
  • Volume
    25
  • Issue
    3
  • fYear
    2006
  • fDate
    3/1/2006 12:00:00 AM
  • Firstpage
    403
  • Lastpage
    412
  • Abstract
    This paper presents a method to address state explosion in timed-circuit verification by using abstraction directed by the failure model. This method allows us to decompose the verification problem into a set of subproblems, each of which proves that a specific failure condition does not occur. To each subproblem, abstraction is applied using safe transformations to reduce the complexity of verification. The abstraction preserves all essential behaviors conservatively for the specific failure model in the concrete description. Therefore, no violations of the given failure model are missed when only the abstract description is analyzed. An algorithm is also shown to examine the abstract error trace to either find a concrete error trace or report that it is a false negative. This paper presents results using the proposed failure-directed abstractions as applied to several large timed-circuit designs.
  • Keywords
    circuit analysis computing; circuit complexity; circuit reliability; failure analysis; formal verification; timing circuits; abstract error trace; complexity verification; concrete error trace; failure condition; failure model; failure-directed abstraction; formal verification; state explosion; timed circuit verification; timed-circuit design; Boolean functions; Circuit testing; Cities and towns; Concrete; Data structures; Decoding; Explosions; Failure analysis; Interleaved codes; Timing; Abstraction; formal verification; timed circuits;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2005.854638
  • Filename
    1597377