DocumentCode :
837215
Title :
Leakage current: Moore´s law meets static power
Author :
Kim, Nam Sung ; Austin, Todd ; Baauw, D. ; Mudge, Trevor ; Flautner, Krisztián ; Hu, Jie S. ; Irwin, Mary Jane ; Kandemir, Mahmut ; Narayanan, Vijaykrishnan
Volume :
36
Issue :
12
fYear :
2003
Firstpage :
68
Lastpage :
75
Abstract :
Off-state leakage is static power, current that leaks through transistors even when they are turned off. The other source of power dissipation in today´s microprocessors, dynamic power, arises from the repeated capacitance charge and discharge on the output of the hundreds of millions of gates in today´s chips. Until recently, only dynamic power has been a significant source of power consumption, and Moore´s law helped control it. However, power consumption has now become a primary microprocessor design constraint; one that researchers in both industry and academia will struggle to overcome in the next few years. Microprocessor design has traditionally focused on dynamic power consumption as a limiting factor in system integration. As feature sizes shrink below 0.1 micron, static power is posing new low-power design challenges.
Keywords :
computer architecture; digital integrated circuits; integrated circuit design; low-power electronics; microprocessor chips; power consumption; dynamic power; feature sizes; leakage current; low-power design challenges; off-state leakage; power consumption; power dissipation; primary microprocessor design constraint; repeated capacitance charge; repeated capacitance discharge; static power; CMOS logic circuits; CMOS technology; Energy consumption; Equations; Frequency; Leakage current; Microprocessors; Moore´s Law; Power dissipation; Threshold voltage;
fLanguage :
English
Journal_Title :
Computer
Publisher :
ieee
ISSN :
0018-9162
Type :
jour
DOI :
10.1109/MC.2003.1250885
Filename :
1250885
Link To Document :
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