Title :
An automated and efficient substrate noise analysis tool
Author :
Li, Hongmei ; Zemke, Cole E. ; Manetas, Giorgos ; Okhmatovski, Vladimir I. ; Rosenbaum, Elyse ; Cangellaris, Andreas C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA
fDate :
3/1/2006 12:00:00 AM
Abstract :
This paper presents a methodology for the efficient modeling of substrate noise coupling. A closed-form Green´s function for nonuniformly doped substrates is employed with the correct singular characteristics. A novel global surface impedance matrix scheme is introduced to efficiently model nonuniformly doped wells, channel stop implants, and buried layers. Layout, device, and netlist extractors are developed so as to integrate our boundary element method (BEM) solver with commercial layout and circuit simulation tools.
Keywords :
Green´s function methods; VLSI; boundary-elements methods; circuit analysis computing; integrated circuit modelling; integrated circuit noise; substrates; system-on-chip; automated substrate noise analysis tool; boundary element method solver; closed form Green functions; global surface impedance matrix scheme; netlist extractor; nonuniform doped substrates; substrate noise coupling; system on a chip; very large scale integrated circuits; Boundary element methods; Circuit simulation; Coupling circuits; Implants; Integrated circuit modeling; Semiconductor device noise; Substrates; Surface impedance; System-on-a-chip; Very large scale integration; Circuit; layout; modeling; noise analysis; simulation; substrate; system on a chip; very large scale integrated (VLSI);
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2005.854628
