Title :
Instrumentation for noise measurements on CMOS transistors for fast detector preamplifiers
Author :
Manghisoni, M. ; Ratti, L. ; Re, V. ; Speziali, V.
Author_Institution :
Dipt. di Ingegneria, Universita di Bergamo, Dalmine, Italy
fDate :
6/1/2002 12:00:00 AM
Abstract :
High-density high-speed CMOS and BiCMOS technologies are today widely used for the design of readout integrated circuits for room-temperature X- and γ-ray imaging detectors. This paper describes a laboratory instrument that was developed to characterize the noise performances of CMOS devices to be used for high-speed analog signal processing. This instrument extends the noise-measuring capabilities beyond 100 MHz to detect the white noise component beyond the 1/f noise corner frequency, which in shorter channel devices shifts to higher values as compared to long-channel transistors.
Keywords :
CMOS analogue integrated circuits; X-ray detection; analogue processing circuits; gamma-ray detection; integrated circuit measurement; preamplifiers; readout electronics; white noise; γ-ray imaging detectors; 1/f noise corner frequency; CMOS transistors; X-ray imaging detectors; detector preamplifiers; high-speed analog signal processing; noise measurements; readout integrated circuits; shorter channel devices; white noise component; BiCMOS integrated circuits; CMOS integrated circuits; CMOS technology; Detectors; High speed integrated circuits; Instruments; Integrated circuit noise; Integrated circuit technology; Noise measurement; Preamplifiers;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2002.1039652
