SEU measurements and predictions on MPTB for a large energetic solar particle event

Author

Campbell, Art ; Buchner, Steve ; Petersen, Ed ; Blake, Bernie ; Mazur, Joe ; Dyer, Clive

Author_Institution

Naval Res. Lab., Washington, DC, USA

Volume

49

Issue

3

fYear

2002

fDate

6/1/2002 12:00:00 AM

Firstpage

1340

Lastpage

1344

Abstract

Single-event upset (SEU) ground testing and rate calculations have been performed for 16-Mb DRAMs flown on the microelectronics and photonics testbed experiment (MPTB) using measured particle spectra and compared with space data from a period of high solar activity. The results show that with the measured spectra, the measurements agree quite well with the calculations. Using just modeled environments, the results do not agree as well

Keywords

DRAM chips; cosmic ray interactions; integrated circuit testing; ion beam effects; proton effects; radiation belts; solar radiation; space vehicle electronics; 16 Mbit; 16-Mb DRAMs; MPTB; SEU measurements; high solar activity; large energetic solar particle event; microelectronics and photonics testbed experiment; particle spectra; single-event upset ground testing; single-event upset rate calculations; space data; space-rate predictions; Energy measurement; Laboratories; Microelectronics; Particle measurements; Photonics; Predictive models; Protons; Random access memory; Single event upset; Testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2002.1039664

Filename

1039664