Title :
SEU measurements and predictions on MPTB for a large energetic solar particle event
Author :
Campbell, Art ; Buchner, Steve ; Petersen, Ed ; Blake, Bernie ; Mazur, Joe ; Dyer, Clive
Author_Institution :
Naval Res. Lab., Washington, DC, USA
fDate :
6/1/2002 12:00:00 AM
Abstract :
Single-event upset (SEU) ground testing and rate calculations have been performed for 16-Mb DRAMs flown on the microelectronics and photonics testbed experiment (MPTB) using measured particle spectra and compared with space data from a period of high solar activity. The results show that with the measured spectra, the measurements agree quite well with the calculations. Using just modeled environments, the results do not agree as well
Keywords :
DRAM chips; cosmic ray interactions; integrated circuit testing; ion beam effects; proton effects; radiation belts; solar radiation; space vehicle electronics; 16 Mbit; 16-Mb DRAMs; MPTB; SEU measurements; high solar activity; large energetic solar particle event; microelectronics and photonics testbed experiment; particle spectra; single-event upset ground testing; single-event upset rate calculations; space data; space-rate predictions; Energy measurement; Laboratories; Microelectronics; Particle measurements; Photonics; Predictive models; Protons; Random access memory; Single event upset; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2002.1039664
