DocumentCode :
838142
Title :
Electrical Conduction Through Small Contact Spots
Author :
Timsit, Roland S.
Author_Institution :
Timron Sci. Consulting, Inc, Toronto, Ont.
Volume :
29
Issue :
4
fYear :
2006
Firstpage :
727
Lastpage :
734
Abstract :
Earlier literature has reported that the voltage-temperature (V-T) relation for electrical contacts, and classical electrical contact theory in general, are invalid where the a-spots are on the order of nanometers. This paper reviews earlier literature dealing with the breakdown of the V-T relation and presents quantitative arguments to propose that this breakdown stems from the ballistic motion of electrons through nanometer-sized constrictions. Earlier literature also suggested that the breakdown of classical theory stems in part from thermal losses from a-spots to contaminant layers in an electrical interface. Through the use of a simple a-spot model, this paper shows that this cooling mechanism is not sufficiently important to affect the validity of the classical V-T relation and classical electrical contact theory in general
Keywords :
contact resistance; cooling; electric breakdown; electrical conductivity; electrical contacts; interface phenomena; a-spot model; classical electrical contact theory; constriction resistance; cooling mechanism; electrical conduction; electrical contact resistance; electrical interface; electrons ballistic motion; nanocontacts; nanometer-sized constrictions; small contact spots; voltage-temperature relation; Contact resistance; Cooling; Electric breakdown; Electric resistance; Electrons; Nanocontacts; Resistance heating; Temperature; Thermal conductivity; Voltage; Constriction resistance; electrical contact resistance; electrical contacts; nanocontacts;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2006.885930
Filename :
4016238
Link To Document :
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