DocumentCode :
838170
Title :
Assessment of Ni/Pd/Au–Pd and Ni/Pd/Au–Ag Preplated Leadframe Packages Subject to Electrochemical Migration and Mixed Flowing Gas Tests
Author :
Zhao, Ping ; Pecht, Michael G. ; Kang, Sungil ; Park, Sechul
Author_Institution :
Dept. of Mech. Eng., Maryland Univ., College Park, MD
Volume :
29
Issue :
4
fYear :
2006
Firstpage :
818
Lastpage :
826
Abstract :
Preplated leadframes packages with a new noble metal finish type were exposed to various electrochemical migration tests, and mixed flowing gas environments to assess the quality and reliability due to these environmental conditions. Packages were tested as discrete parts and also as parts mounted onto printed circuit boards to assess the effect of reflow soldering. Selected packages with SnPb plated leadframes were tested for comparison purposes. After test exposure, optical microscopy, scanning electron microscope, and energy dispersive spectroscopy analyses were conducted to evaluate the corrosion behavior. Corrosion and creep corrosion on the leads were observed on all the preplated test samples subject to the mixed flowing gas. Creep corrosion over the mold compound surface was identified on the unmounted quad flat no-lead packages. The creep corrosion products were found to be electrically conductive and could bridge adjacent lead pairs
Keywords :
corrosion testing; electromigration; electronics packaging; gold alloys; lead alloys; metallisation; nickel; optical microscopy; palladium; palladium alloys; reflow soldering; scanning electron microscopes; silver alloys; tin alloys; Ni-Pd-AuAg; Ni-Pd-AuPd; SnPb; corrosion behavior; creep corrosion; electrochemical migration; energy dispersive spectroscopy; metal finish type; mixed flowing gas tests; mold compound surface; optical microscopy; preplated leadframes packages; reflow soldering; scanning electron microscope; Circuit testing; Corrosion; Creep; Electron optics; Lead; Optical microscopy; Packaging; Printed circuits; Reflow soldering; Scanning electron microscopy; Creep corrosion; electrochemical migration; mixed flowing gas; preplated leadframe;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2006.885962
Filename :
4016241
Link To Document :
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