• DocumentCode
    838197
  • Title

    Fundamental limitations of switched-capacitor sigma-delta modulators

  • Author

    Dias, V.F. ; Palmisano, G. ; O´Leary, P. ; Maloberti, F.

  • Author_Institution
    Dept. of Electron., Pavia Univ., Italy
  • Volume
    139
  • Issue
    1
  • fYear
    1992
  • fDate
    2/1/1992 12:00:00 AM
  • Firstpage
    27
  • Lastpage
    32
  • Abstract
    In recent years oversampling techniques have become very popular for implementing high resolution analogue-to-digital (A/D) convertors. To obtain high resolution the order of the modulator L and the oversampling ratio M are commonly seen as degrees of freedom since no theoretical limit exists for the maximum achievable signal-to-quantisation-noise ratio (SNR). However, in practical cases two fundamental constraints need to be considered in the design of the modulator, namely the thermal noise generated by the switches and the amplifiers and the settling error due to finite values of the gain-bandwidth product and the slew rate. The authors present a closed form relation for the SNR performance of generic L-order N -bit modulators designed with switched-capacitor (SC) techniques. The relation takes into account all the above constraints. One of the major conclusions is that state-of-the-art 2nd-order SC modulators are sufficient to achieve competitive SNR performance
  • Keywords
    analogue-digital conversion; coding errors; interference (signal); modulators; switched capacitor networks; thermal noise; A/D convertors; ADC; SC integrator; SNR performance; gain-bandwidth product; high resolution; oversampling ratio; settling error; signal/quantisation noise ratio; slew rate; switched-capacitor sigma-delta modulators; thermal noise;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices and Systems, IEE Proceedings G
  • Publisher
    iet
  • ISSN
    0956-3768
  • Type

    jour

  • Filename
    125113