A Secondary Emission-Multiwire Chamber for Ganil Heavy Ion Beams Tuning

We present a secondary emission-monitor based on a multiwire chamber, providing beam profile measurements. It has been designed for the extracted beams of GANIL, and tested particularly at ALICE (I. P. N. Orsay) with different heavy ions, such as oxygen and argon, for beam intensities between 10 and 800 nA. The secondary emission yield being important for low and medium energy heavy ions, the size of the wires has been reduced to 10 ¿m, nevertheless providing a measurable signal. The profiles can be displayed on a scope or processed by a microprocessor, allowing calculations of beam characteristics such as the beam emittance.