Title :
Ellipsometric analysis for growth of Ag2S film and effect of oil on corrosion resistance of Ag contact surface
Author_Institution :
Dept. of Practical Life Studies, Hyogo Univ. of Teacher Educ., Japan
fDate :
3/1/1989 12:00:00 AM
Abstract :
By applying ellipsometric analysis, the growth laws of Ag2 S film on Ag contact surface exposed to H2S gas environment at the rate of 3 p.p.m., 80-85% RH, at 40°C were determined. Parameters for corrosion kinetics related to the growth law of Ag2S film were obtained. The growth rate of the film decreased in four stages, as the sulfuration time became longer. The lowering of the growth rate was found to correspond to microscopic changes in the surface morphology. The contact resistance property was deteriorated by growth of Ag2S film thicker than 500-750 Å. The effect of a stearic acid coating on corrosion resistance was confirmed. The optimum thickness of the oil film to sustain low contact resistance was found; this thickness is around several hundred Å
Keywords :
contact resistance; corrosion protective coatings; electrical contacts; ellipsometry; hydrogen compounds; silver; silver compounds; 40 C; 500 to 750 A; Ag contact surface; H2S gas environment; contact resistance; corrosion kinetics; corrosion resistance; corrosive gases; ellipsometric analysis; growth law of Ag2S film; growth rate; stearic acid coating; sulfides; Corrosion; Ellipsometry; Optical films; Optical polarization; Optical refraction; Petroleum; Surface cleaning; Surface morphology; Surface resistance; Thickness measurement;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
