Title :
Fundamentals of testability-a tutorial
Author :
Fritzemeier, Ronald R. ; Nagle, H. Troy ; Hawkins, Charles F.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fDate :
5/1/1989 12:00:00 AM
Abstract :
A review is presented of electrical testing, failure mechanisms, fault models, fault simulation, testability analysis, and test-generation methods for CMOS VLSI circuits. The relationships between the most commonly used fault models are explored. Various fault simulation methods are contrasted. The basic mechanisms used in test-vector generation are illustrated by examples. The importance of testability analysis as a guide to design and test generation is discussed. Algorithms for automatic test-pattern generation are summarized.<>
Keywords :
CMOS integrated circuits; VLSI; failure analysis; integrated circuit testing; CMOS VLSI circuits; automatic test-pattern generation; electrical testing; failure mechanisms; fault simulation; test-generation methods; test-vector generation; testability analysis; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Diodes; Electronic equipment testing; Electrostatic discharge; Semiconductor device modeling; Tutorial; Very large scale integration;
Journal_Title :
Industrial Electronics, IEEE Transactions on
