• DocumentCode
    838868
  • Title

    A broadband and scalable model for on-chip inductors incorporating substrate and conductor loss effects

  • Author

    Guo, Jyh-Chyurn ; Tan, Teng-Yang

  • Author_Institution
    Dept. of Electron. Eng., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
  • Volume
    53
  • Issue
    3
  • fYear
    2006
  • fDate
    3/1/2006 12:00:00 AM
  • Firstpage
    413
  • Lastpage
    421
  • Abstract
    A new T-model has been developed to accurately simulate the broadband characteristics of on-Si-chip spiral inductors, up to 20 GHz. The spiral coil and substrate RLC networks built in the model play a key role responsible for conductor loss and substrate loss in the wideband regime, which cannot be accurately described by the conventional π-model. Good match with the measured S-parameters, L(ω), Re(Zin(ω)), and Q(ω) proves the proposed T-model. Besides the broadband feature, scalability has been justified by good match with a linear function of coil numbers for all model parameters employed in the RLC networks. The satisfactory scalability manifest themselves physical parameters rather than curve fitting. A parameter extraction flow is established through equivalent circuit analysis to enable automatic parameter extraction and optimization. This scalable inductor model will facilitate optimization design of on-chip inductor and the accuracy proven up to 20 GHz can improve RF circuit simulation accuracy demanded by broadband design.
  • Keywords
    RLC circuits; S-parameters; equivalent circuits; inductors; integrated circuit modelling; radiofrequency integrated circuits; RF circuit simulation; RLC networks; S-parameters; broadband characteristics; conductor loss; equivalent circuit analysis; inductor model; lossy substrate; on-chip inductors; parameter extraction; parameter optimization; spiral inductors; substrate loss; Coils; Conductors; Curve fitting; Equivalent circuits; Inductors; Parameter extraction; Scalability; Scattering parameters; Spirals; Wideband; Broadband; inductor; lossy substrate; scalable;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2005.864409
  • Filename
    1597515