DocumentCode
838946
Title
Incoming test strategy based upon in-process failure and repair costs
Author
Ballew, W. David ; Streb, Lauren M.
Author_Institution
AT&T, Oklahoma City, OK, USA
Volume
36
Issue
2
fYear
1989
fDate
5/1/1989 12:00:00 AM
Firstpage
203
Lastpage
210
Abstract
An economic model is developed that challenges traditional statistical quality control methods in the factory. Incoming inspection levels can be determined as a function of both the PPM failure rates and the lot-to-lot stability. Since current incoming failure rates have fallen two orders of magnitude to below 100 PPM, the model can be used to re-evaluate conventional test strategies in high-volume manufacturing operations. Process variability as measured by statistical process control methods can now be monitored as lot stability and incoming inspection levels are adjusted accordingly.<>
Keywords
economics; inspection; statistical process control; economic model; in-process failure; inspection; repair costs; statistical process control; test strategy; Circuit testing; Cities and towns; Communication industry; Computer integrated manufacturing; Continuous improvement; Costs; Manufacturing industries; Monitoring; Production facilities; Switches;
fLanguage
English
Journal_Title
Industrial Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0278-0046
Type
jour
DOI
10.1109/41.19070
Filename
19070
Link To Document