• DocumentCode
    838946
  • Title

    Incoming test strategy based upon in-process failure and repair costs

  • Author

    Ballew, W. David ; Streb, Lauren M.

  • Author_Institution
    AT&T, Oklahoma City, OK, USA
  • Volume
    36
  • Issue
    2
  • fYear
    1989
  • fDate
    5/1/1989 12:00:00 AM
  • Firstpage
    203
  • Lastpage
    210
  • Abstract
    An economic model is developed that challenges traditional statistical quality control methods in the factory. Incoming inspection levels can be determined as a function of both the PPM failure rates and the lot-to-lot stability. Since current incoming failure rates have fallen two orders of magnitude to below 100 PPM, the model can be used to re-evaluate conventional test strategies in high-volume manufacturing operations. Process variability as measured by statistical process control methods can now be monitored as lot stability and incoming inspection levels are adjusted accordingly.<>
  • Keywords
    economics; inspection; statistical process control; economic model; in-process failure; inspection; repair costs; statistical process control; test strategy; Circuit testing; Cities and towns; Communication industry; Computer integrated manufacturing; Continuous improvement; Costs; Manufacturing industries; Monitoring; Production facilities; Switches;
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/41.19070
  • Filename
    19070