DocumentCode :
838984
Title :
Improved objective function for device model parameter extraction
Author :
Middelhoek, M.G.
Author_Institution :
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
Volume :
139
Issue :
1
fYear :
1992
fDate :
2/1/1992 12:00:00 AM
Firstpage :
126
Lastpage :
130
Abstract :
Curve-fitting is a reliable strategy for the automated extraction of the parameter set of an analytical device model from measured data. This strategy always implies the minimisation of a nonlinear objective function that comprises the differences between a set of measured data points and the model. A new type of objective function is proposed that is not based on the common concept of a division between dependent and independent terminal variables, but on a concept where all terminal variables are equally treated. This objective function, which is derived from the principle of maximum likelihood estimation, can be expressed as a sum of squares of nonlinear functions, so that the computationally efficient class of Gauss-Newton methods can be used for its optimisation. Results show that, for strongly nonlinear models in particular, the convergence properties are significantly improved
Keywords :
convergence of numerical methods; curve fitting; semiconductor device models; Gauss-Newton methods; analytical device model; convergence properties; curve fitting; device model parameter extraction; maximum likelihood estimation; measured data points; nonlinear objective function; objective function; strongly nonlinear models;
fLanguage :
English
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings G
Publisher :
iet
ISSN :
0956-3768
Type :
jour
Filename :
125128
Link To Document :
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