DocumentCode
839007
Title
Design of self-diagnostic boards by signature analysis
Author
Karpovsky, Mark G. ; Nagvajara, Prawat
Author_Institution
Dept. of Electr., Comput & Syst. Eng., Boston Univ., MA, USA
Volume
36
Issue
2
fYear
1989
fDate
5/1/1989 12:00:00 AM
Firstpage
241
Lastpage
245
Abstract
The authors present a single-faulty-chip diagnostic technique which requires only two reference signatures for any number of chips on the original board. With this technique, it is possible to reduce substantially the hardware overhead compared to the diagnostic technique based on separate testing of each chip on the board. The technique can be also used for identification of faulty printed boards in a system or for identification of faulty processors in a multiprocessor system.<>
Keywords
automatic testing; logic testing; printed circuit design; printed circuit testing; faulty processors; multiprocessor system; printed boards; self-diagnostic boards; signature analysis; single-faulty-chip diagnostic technique; Automatic testing; Design for testability; Fault diagnosis; Hardware; Manufacturing; Multiprocessing systems; System buses; System testing; Test pattern generators; Very large scale integration;
fLanguage
English
Journal_Title
Industrial Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0278-0046
Type
jour
DOI
10.1109/41.19075
Filename
19075
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