• DocumentCode
    839199
  • Title

    A super beta bipolar transistor using SiGe-base surface accumulation layer transistor(SALTran) concept: a simulation study

  • Author

    Kumar, M. Jagadesh ; Singh, Preeti

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol., New Delhi, India
  • Volume
    53
  • Issue
    3
  • fYear
    2006
  • fDate
    3/1/2006 12:00:00 AM
  • Firstpage
    577
  • Lastpage
    579
  • Abstract
    Current gain is an important design parameter of bipolar transistors. While a SiGe base is commonly used to increase the current gain, the recently reported surface accumulation layer transistor (SALTran) concept has been shown to give a similar current gain enhancement. Using two-dimensional numerical simulation studies, we show for the first time that a combination of the SiGe base and the SALTran concept can be used to realize super beta bipolar transistors with peak current gains more than 12000.
  • Keywords
    Ge-Si alloys; accumulation layers; bipolar transistors; semiconductor device models; SiGe; bipolar transistors; current gain; surface accumulation layer transistor; Analog circuits; Bipolar transistors; Charge carrier processes; Circuit simulation; Doping profiles; Electron emission; Germanium silicon alloys; Numerical simulation; Photonic band gap; Silicon germanium; Bipolar transistor; SiGe base; current gain; simulation; surface accumulation layer transistor (SALTran);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2005.863538
  • Filename
    1597541