• DocumentCode
    839214
  • Title

    A Physical Model for On-Chip Spiral Inductors With Accurate Substrate Modeling

  • Author

    Huo, X. ; Chan, Philip C.H. ; Chen, Kevin J. ; Luong, Howard C.

  • Author_Institution
    BDTS, Hong Kong Sci. & Technol. Parks Corp., Shatin
  • Volume
    53
  • Issue
    12
  • fYear
    2006
  • Firstpage
    2942
  • Lastpage
    2949
  • Abstract
    A physical-based analytical model for on-chip inductors is developed. A ladder structure is used to model the skin and proximity effects in metal lines. The substrate electric and substrate magnetic losses are accurately modeled by RC and RL ladder structures, respectively. The effective inductance reduction due to the eddy current in the lossy silicon substrate at high frequency is modeled by a negative mutual inductance between the inductor and the substrate. All the model parameters can be calculated from the layout and process parameters. On-chip inductors with different geometries and substrate resistivities were fabricated for the verifications. The measured results are in very good agreement with the proposed model. This generic model can be applied to various substrate resistivities; thus, it is suitable for different technologies. This model can facilitate the design and optimization of on-chip inductors for RF IC applications
  • Keywords
    eddy current losses; inductors; radiofrequency integrated circuits; system-on-chip; RF IC applications; eddy current; inductor modeling; integrated inductors; ladder structure; lossy silicon substrate; magnetic losses; on-chip spiral inductors; physical model; proximity effects; radio frequency IC; skin effects; substrate modeling; Analytical models; Conductivity; Eddy currents; Inductance; Inductors; Integrated circuit modeling; Magnetic losses; Proximity effect; Skin; Spirals; Inductor modeling; integrated inductors; radio-frequency (RF) ICs; silicon substrate;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2006.885091
  • Filename
    4016344