Title :
Investigation of Bragg gratings on planar InGaAsP/InP waveguides at normal and oblique incidence
Author :
Heise, G. ; März, R. ; Schienle, M.
Author_Institution :
Siemens AG, Munich, West Germany
fDate :
4/1/1989 12:00:00 AM
Abstract :
The polarization-dependent mode coupling of Bragg gratings on planar InGaAsP/InP waveguides is investigated by transmittance and reflectance measurements at normal and oblique incidence in the 1.5- mu m wavelength region. Strong coupling between TE (transverse electric) and TM (transverse magnetic) modes is observed at oblique incident, whereas the TE-TE coupling vanishes at an incidence angle of 45 degrees . The behavior of the near field close to the Bragg wavelength and the effects of radiation into the substrate are analyzed. It is experimentally shown that small deformations of the phase fronts on the input side lead to strong interference effects on the output side.<>
Keywords :
III-V semiconductors; diffraction gratings; gallium arsenide; indium compounds; light polarisation; light reflection; light transmission; optical couplers; optical waveguides; 1.5 micron; Bragg gratings; Bragg wavelength; InGaAsP-InP; TE modes; TE-TE coupling; TM modes; interference effects; planar waveguides; polarization-dependent mode coupling; reflectance measurements; transmittance measurements; transverse electric modes; transverse magnetic modes; Bragg gratings; Couplings; Indium phosphide; Magnetic field measurement; Near-field radiation pattern; Planar waveguides; Polarization; Reflectivity; Tellurium; Wavelength measurement;
Journal_Title :
Lightwave Technology, Journal of
