Investigation of Bragg gratings on planar InGaAsP/InP waveguides at normal and oblique incidence

Author

Heise, G. ; März, R. ; Schienle, M.

Author_Institution

Siemens AG, Munich, West Germany

Volume

7

Issue

4

fYear

1989

fDate

4/1/1989 12:00:00 AM

Firstpage

735

Lastpage

739

Abstract

The polarization-dependent mode coupling of Bragg gratings on planar InGaAsP/InP waveguides is investigated by transmittance and reflectance measurements at normal and oblique incidence in the 1.5- mu m wavelength region. Strong coupling between TE (transverse electric) and TM (transverse magnetic) modes is observed at oblique incident, whereas the TE-TE coupling vanishes at an incidence angle of 45 degrees . The behavior of the near field close to the Bragg wavelength and the effects of radiation into the substrate are analyzed. It is experimentally shown that small deformations of the phase fronts on the input side lead to strong interference effects on the output side.<>

Keywords

III-V semiconductors; diffraction gratings; gallium arsenide; indium compounds; light polarisation; light reflection; light transmission; optical couplers; optical waveguides; 1.5 micron; Bragg gratings; Bragg wavelength; InGaAsP-InP; TE modes; TE-TE coupling; TM modes; interference effects; planar waveguides; polarization-dependent mode coupling; reflectance measurements; transmittance measurements; transverse electric modes; transverse magnetic modes; Bragg gratings; Couplings; Indium phosphide; Magnetic field measurement; Near-field radiation pattern; Planar waveguides; Polarization; Reflectivity; Tellurium; Wavelength measurement;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.19104

Filename

19104