• DocumentCode
    839297
  • Title

    GaN HFET digital circuit technology for harsh environments

  • Author

    Hussain, T. ; Micovic, M. ; Tsen, T. ; Delaney, M. ; Chow, D. ; Schmitz, A. ; Hashimoto, P. ; Wong, D. ; Moon, J.S. ; Hu, Ming ; Duvall, J. ; McLaughlin, D.

  • Author_Institution
    HRL Labs., Malibu, CA, USA
  • Volume
    39
  • Issue
    24
  • fYear
    2003
  • Firstpage
    1708
  • Lastpage
    1709
  • Abstract
    The first demonstration of GaN digital circuits is reported. First-generation GaN digital technology has already shown high yields for circuits of considerable complexity. Specifically, a 31-stage ring oscillator was implemented using 217 transistors. Properties of the AlGaN/GaN material system that enable outstanding power handling capabilities of GaN heterojunction field effect transistors (HFETs), i.e. large bandgap, high breakdown field and high saturation velocity, also make it attractive for digital applications in harsh environments. Because of these unique material characteristics, GaN digital control circuits have the potential to operate in high radiation environments, at elevated temperatures, and directly from high voltage rails. Successful operation of GaN 31-stage ring oscillators at the highest base-plate temperature attainable by the test setup of 265°C, indicates that these circuits can operate at significantly higher temperatures.
  • Keywords
    III-V semiconductors; aluminium compounds; field effect transistor circuits; gallium compounds; high-temperature electronics; integrated circuit design; integrated circuit measurement; logic circuits; wide band gap semiconductors; 265 degC; AlGaN-GaN; AlGaN/GaN material characteristics; GaN HFET digital circuit technology; base-plate temperature; elevated temperature operation; harsh environments; heterojunction field effect transistors; high breakdown field; high circuit yield; high radiation environments; high saturation velocity; high voltage operation; large bandgap; ring oscillators;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20031129
  • Filename
    1251530