Title :
Single-Period InAs–GaAs Quantum-Dot Infrared Photodetectors
Author :
Chou, Shu-Ting ; Lin, Shih-Yen ; Tseng, Chi-Che ; Chen, Yi-Hao ; Chen, Cheng-Nan ; Wu, Meng-Chyi
Author_Institution :
Res. Center for Appl. Sci., Acad. Sinica, Taipei
Abstract :
In this letter, we investigate the performance of single-period InAs-GaAs quantum-dot (QD) infrared photodetectors, in which the single-period QD is sandwiched by different thicknesses of the undoped GaAs confinement layers. By using a 5-nm p-type GaAs layer as a current blocking barrier, the investigated three devices exhibit no response, the highest response, and the medium response, respectively. It is attributed to three different electron occupancy situations in the QD region resulted from the various locations of the Fermi level. A higher barrier for the thermionic emission current is observed for the device with a lower Fermi level in the QD structure. It is attributed to the acceptor-like behavior of the depleted QD such that a higher barrier height would be observed.
Keywords :
Fermi level; III-V semiconductors; gallium compounds; indium compounds; infrared detectors; photodetectors; semiconductor quantum dots; thermionic emission; Fermi level; GaAs confinement layers; InAs-GaAs; InAs-GaAs quantum-dot infrared photodetectors; current blocking barrier; electron occupancy situations; size 5 nm; thermionic emission current; Capacitive sensors; Electromagnetic wave absorption; Electrons; Fabrication; Gallium arsenide; Molecular beam epitaxial growth; Photodetectors; Quantum dots; Quantum well devices; Thermionic emission; Quantum dot (QD); quantum-dot infrared photodetector (QDIP);
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2008.928847