DocumentCode :
839457
Title :
A Quantum-Corrected Monte Carlo Study on Quasi-Ballistic Transport in Nanoscale MOSFETs
Author :
Tsuchiya, Hideaki ; Fujii, Kazuya ; Mori, Takashi ; Miyoshi, Tanroku
Author_Institution :
Dept. of Electr. & Electron. Eng., Kobe Univ.
Volume :
53
Issue :
12
fYear :
2006
Firstpage :
2965
Lastpage :
2971
Abstract :
In this paper, the authors study a quasi-ballistic transport in nanoscale Si-MOSFETs based upon a quantum-corrected Monte Carlo device simulation to explore an ultimate device performance. It was found that, when a channel length becomes shorter than 30 nm, an average electron velocity at the source-end of the channel increases due to ballistic transport effects, and then, it approaches a ballistic limit in a sub-10-nm regime. Furthermore, the authors elucidated a physical mechanism creating an asymmetric momentum distribution function at the source-end of the channel and the influences of backscattering from the channel region. The authors also demonstrated that an electron injection velocity at a perfectly ballistic transport is independent of the channel length and corresponds well to a prediction from Natori´s analytical model
Keywords :
MOSFET; Monte Carlo methods; ballistic transport; elemental semiconductors; nanotechnology; silicon; Natori´s analytical model; Si; asymmetric momentum distribution function; ballistic transport effects; channel length; electron injection velocity; nanoscale Si-MOSFET; quantum-corrected Monte Carlo simulation; quasiballistic transport; Backscatter; Ballistic transport; Distribution functions; Electrons; Equations; MOSFETs; Monte Carlo methods; Nanoscale devices; Particle scattering; Quantum mechanics; Nanoscale MOSFET; quantum effects; quantum-corrected Monte Carlo (MC) simulation; quasi-ballistic transport;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2006.885672
Filename :
4016366
Link To Document :
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