• DocumentCode
    839795
  • Title

    Electromechanical coupling to Lamb and shear-horizontal modes in piezoelectric plates

  • Author

    Adler, Eric L.

  • Author_Institution
    Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
  • Volume
    36
  • Issue
    2
  • fYear
    1989
  • fDate
    3/1/1989 12:00:00 AM
  • Firstpage
    223
  • Lastpage
    230
  • Abstract
    Recent theoretical studies and experiments have been shown that interdigital transducers can couple strongly to plate modes in piezoelectric materials and in piezoelectric-on-nonpiezoelectric composite membranes. The calculated velocity dispersion and electromechanical coupling factors for plate modes in representative piezoelectric materials are described. The frequency dependence of velocity and electromechanical coupling factors are given, under different metallization conditions, for generalized stiffened-Lamb, pure stiffened-Lamb, and stiffened-shear (shear-horizontal) modes, for various plate orientations in lithium niobate, lithium tantalate, quartz, bismuth germanium oxide, and zinc oxide. For lithium niobate, electromechanical-coupling values as high as 15% are found under narrowband bandpass conditions, and 5% under wideband low-pass conditions. For lithium tantalate, bismuth germanium oxide, coupling values of 0.5, 2, and 4% are obtained. For quartz with its weaker piezoelectricity, the coupling is still made smaller.<>
  • Keywords
    piezoelectricity; surface acoustic waves; Bi/sub 12/GeO/sub 20/; Lamb modes; LiNbO/sub 3/; LiTaO/sub 3/; SAW; ZnO; electromechanical coupling factors; interdigital transducers; metallization; piezoelectric plates; plate modes; shear-horizontal modes; velocity; velocity dispersion; Biomembranes; Bismuth; Frequency dependence; Germanium; Lithium compounds; Lithium niobate; Metallization; Piezoelectric materials; Piezoelectric transducers; Zinc oxide;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.19155
  • Filename
    19155