DocumentCode
839815
Title
Challenges Related to Reliability in Nano Electronics
Author
Way Kuo
Volume
55
Issue
4
fYear
2006
Firstpage
569
Lastpage
570
Abstract
Abs
Keywords
design; fault tolerance; military systems; nanobiotechnology; nanoelectronics; reviews; MEMS; biotechnology; design; failure mechanism; fault tolerance; military system; nanoelectronics; nanofabrication; nanoproducts; nanotechnology; reliability; Capacitors; Computer aided manufacturing; Fabrication; Failure analysis; Integrated circuit reliability; Integrated circuit technology; Life estimation; Manufacturing industries; Microprocessors; Virtual manufacturing;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2006.884585
Filename
4016402
Link To Document