Title :
Handling variations and uncertainties
fDate :
6/1/2006 12:00:00 AM
Abstract :
With increased technology scaling, high variability and low reliability will likely be the main challenges for chip design and testing. This issue discusses some of the key issues for handling increasing variations and uncertainties. Also, D&T´s plans for 2007 special themes have been finalized.
Keywords :
Testing; Uncertainty; reliability; statistical design; test process; variation;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
15BF0463-997D-4A3C-9D27-D53BCC4AB688
