Title :
Nickel-diffused lithium niobate optical waveguide with process-dependent polarization
Author :
Liao, Yu-Pin ; Chen, Der-Jung ; Lu, Ruei-Chang ; Wang, Way-Seen
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fDate :
4/1/1996 12:00:00 AM
Abstract :
Single-ordinary, single-extraordinary, and random polarization optical waveguides fabricated on Z-cut lithium niobate substrates by varying nickel diffusion time and temperature are presented. A relationship of the refractive index changes versus concentration for the nickel diffused waveguides is obtained. Moreover, a single-extraordinarily polarized Mach-Zehnder interferometer was fabricated for electrooptical characterization. The measured half-wave voltage is as low as 4.3 V and the extinction ratio is greater than 25 dB.
Keywords :
Mach-Zehnder interferometers; diffusion; electro-optical modulation; light polarisation; lithium compounds; nickel; optical planar waveguides; refractive index; 4.3 V; LiNbO/sub 3/:Ni; Ni diffusion time; Z-cut lithium niobate substrates; concentration; electrooptical characterization; extinction ratio; half-wave voltage; nickel-diffused lithium niobate optical waveguide; planar waveguides; process-dependent polarization; random polarization optical waveguides; refractive index changes; single-extraordinarily polarized Mach-Zehnder interferometer; single-extraordinary optical waveguides; single-ordinary polarization optical waveguides; temperature; Lithium niobate; Nickel; Optical interferometry; Optical polarization; Optical refraction; Optical variables control; Optical waveguides; Refractive index; Temperature; Waveguide transitions;
Journal_Title :
Photonics Technology Letters, IEEE
