DocumentCode :
840119
Title :
Modal Analysis of Microstrip Lines Using Singular Value Decomposition Analysis of FDTD Simulations
Author :
Ahmed, Shahid ; Li, Er-Ping
Author_Institution :
Illinois Inst. of Technol., Chicago, IL
Volume :
50
Issue :
3
fYear :
2008
Firstpage :
687
Lastpage :
696
Abstract :
A comprehensive modal analysis of microstrip circuits using the singular value decomposition analysis of finite-difference time-domain simulation results has been performed. The detailed information have revealed new physical features, which are, to our best knowledge, seen for the first time. This realistic approach includes the 3-D configuration of structures and the full-wave electromagnetic properties. Increasing the aspect ratio of a continuous microstrip line strengthens the fundamental transverse electromagnetic mode and weakens the higher order transverse magnetic modes. However, the introduction of gap discontinuity in the line enhances the mode strength in the vicinity of the gap. The physical interpretations of these results have been discussed in the paper. Moreover, the effects of line topology on the evolution of modes are illustrated. This investigation has physical significance in the practical design of high-speed interconnects and system-on-chip.
Keywords :
finite difference time-domain analysis; microstrip circuits; microstrip lines; singular value decomposition; FDTD simulations; continuous microstrip line; finite-difference time-domain simulation; gap discontinuity; high-speed interconnects; microstrip circuits; modal analysis; singular value decomposition analysis; system-on-chip; transverse electromagnetic mode; Analytical models; Circuit simulation; Finite difference methods; Integrated circuit interconnections; Microstrip; Modal analysis; Performance analysis; Singular value decomposition; Time domain analysis; Topology; Aspect ratio; microstrip circuits; modal analysis; singular value decomposition (SVD);
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2008.927926
Filename :
4603116
Link To Document :
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