Title :
Angle Selective Enhancement of Beam Deflection in High-Speed Electrooptic Switches
Author :
Glebov, Alexei L. ; Smirnov, V. I. ; Lee, M. G. ; Glebov, L. B. ; Sugama, Atsushi ; Aoki, Shigehisa ; Rotar, V.
Author_Institution :
Device Integration Technol. Dept., Fujitsu Labs. of America, Sunnyvale, CA
fDate :
5/1/2007 12:00:00 AM
Abstract :
Fast electrooptic (EO) deflector switches (DSs) have high potential for applications in optical burst transport networks. EO properties of active materials used in the DSs can impose some limitations on their beam deflection efficiencies. Using a test setup with planar silica waveguide microlens arrays, thin-film ferroelectric oxide beam deflectors, and glass volume Bragg gratings, we demonstrate that the beam deflection angle can be increased by more than a factor of 5 for the same switching voltages. The technology enables significant performance improvement of the fast EO DSs
Keywords :
Bragg gratings; electro-optical switches; ferroelectric thin films; microlenses; optical arrays; optical burst switching; optical deflectors; optical planar waveguides; silicon compounds; angle selective enhancement; beam deflection; electrooptic switches; electrooptical properties; fast deflector switches; ferroelectric oxide beam deflectors; glass volume Bragg gratings; high-speed switches; microlens arrays; optical burst transport networks; planar silica waveguide; thin-film beam deflectors; Arrayed waveguide gratings; Decision support systems; Electrooptic deflectors; Electrooptical waveguides; Ferroelectric materials; High speed optical techniques; Optical fiber networks; Optical materials; Optical switches; Testing; Beam deflectors; PLZT; electrooptic (EO) switches; ferroelectric thin films; microoptics; volume Bragg gratings (BGs);
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2007.895066
