• DocumentCode
    840247
  • Title

    Influence of compressive length of normal stress on degradation in Bi-2223 tapes

  • Author

    Takao, Tomoaki ; Ito, Toru ; Umekawa, Kenji ; Fukasawa, Yuta ; Tanaka, Hideki ; Umeda, Masaichi

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Sophia Univ., Tokyo, Japan
  • Volume
    15
  • Issue
    2
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    2488
  • Lastpage
    2491
  • Abstract
    We have applied transversal-compressive force to typical Bi-2223 tapes with multi-filaments and a Ag-alloy matrix. The degradation of superconducting performance of the tapes against the compressive force was measured. In the experiment, damaged lengths along the tape were changed, and hence, the dependence of the damaged lengths on the Ic degradation were also evaluated. According to the experimental results, in spite of the same stress to the tapes, the Ic degradation clearly depended on the loaded length along the tape. Therefore, the superconducting property degraded with increasing of the damaged length. When the transversal-compressive force is applied to the tape surfaces, it should be carefully noted that the degradation depends on the damaged length along the tape.
  • Keywords
    bismuth compounds; calcium compounds; compressive strength; compressive testing; critical currents; force; high-temperature superconductors; lead compounds; multifilamentary superconductors; plastics; silver alloys; stress effects; strontium compounds; superconducting tapes; 10 mm; 3 to 6 mm; Bi2PbSr2Ca2Cu3O10; compressive length; critical current degradation; damaged lengths; multifilaments; normal stress; silver alloy matrix; superconducting performance degradation; superconducting tape surfaces; transversal compressive force; Compressive stress; Conductors; Critical current; Degradation; Fiber reinforced plastics; Force measurement; Magnetic field measurement; Multifilamentary superconductors; Superconducting films; Superconducting magnets; Bi-2223; compressive stress; critical current; degradation;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2005.847495
  • Filename
    1440170