DocumentCode
840294
Title
Accurate Transient Simulation of Interconnects Characterized by Band-Limited Data With Propagation Delay Enforcement in a Modified Nodal Analysis Framework
Author
Lalgudi, Subramanian N. ; Engin, Ege ; Casinovi, Giorgio ; Swaminathan, Madhavan
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
Volume
50
Issue
3
fYear
2008
Firstpage
715
Lastpage
729
Abstract
A numerical-convolution-based approach has been proposed for the accurate transient simulation of interconnects characterized by band-limited (b.l.) frequency-domain (f.d.) data and terminated by arbitrary equivalent circuits. Propagation delay is enforced in the transient results by obtaining causal impulse responses from b.l.f.d. data, extracting the propagation delays from them, and enforcing the delays in the causal impulse responses. Causal impulse responses are obtained through a new minimum- phase/all-pass decomposition of the frequency data. In this decomposition, a new form for the all-pass component has been proposed that preserves the sign of the original frequency response in the reconstructed response, unlike the prior approaches, leading to an accurate transient result. Arbitrary terminations are conveniently handled by integrating the numerical convolution in a modified nodal analysis (MNA) framework, a framework used by commercial circuit simulators, through a new transient simulation formulation. Numerical results demonstrating the accuracy and capability of the proposed procedure have been presented.
Keywords
circuit simulation; convolution; delays; frequency response; frequency-domain analysis; interconnections; transient analysis; transient response; accurate transient simulation; band-limited data; causal impulse responses; equivalent circuits; frequency response; frequency-domain data; minimum-phase-all-pass decomposition; modified nodal analysis framework; numerical-convolution-based approach; propagation delay enforcement; scattering parameters; Analytical models; Circuit simulation; Convolution; Data mining; Equivalent circuits; Frequency domain analysis; Frequency response; Integrated circuit interconnections; Propagation delay; Transient analysis; Causality; convolution; scattering parameters; signal flow graphs; transient response;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.2008.924394
Filename
4603133
Link To Document