DocumentCode :
840450
Title :
Molecular beam epitaxy-grown AlGaInAs/InP distributed Bragg reflectors for 1.55 μm VCSELs
Author :
Reddy, M.H.M. ; Asano, T. ; Koda, R. ; Buell, D.A. ; Coldren, L.A.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Volume :
38
Issue :
20
fYear :
2002
fDate :
9/26/2002 12:00:00 AM
Firstpage :
1181
Lastpage :
1182
Abstract :
Solid source molecular beam epitaxy with valved P cracker source is used for the first time to grow an AlGaInAs/InP distributed Bragg reflector (DBR). The DBR shows a measured reflectivity of 98.78% for 25 pairs with a stop band of more than 100 nm. Current-voltage study shows a low drop of 4 mV/pair
Keywords :
III-V semiconductors; aluminium compounds; distributed Bragg reflector lasers; gallium arsenide; indium compounds; molecular beam epitaxial growth; optical fibre networks; optical transmitters; semiconductor epitaxial layers; semiconductor growth; semiconductor lasers; surface emitting lasers; 1.55 micron; AlGaInAs-InP; AlGaInAs/InP; DBRs; VCSELs; current-voltage study; distributed Bragg reflectors; fibre optical communications; reflectivity; solid source molecular beam epitaxy; stop band;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20020796
Filename :
1040985
Link To Document :
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