• DocumentCode
    840612
  • Title

    Sensitivity analysis of simulations for magnetic particle inspection using the finite-element method

  • Author

    Lee, J.Y. ; Lee, S.J. ; Jiles, D.C. ; Garton, M. ; Lopez, R. ; Brasche, L.

  • Author_Institution
    IT Res. Center of Samsung SDS, Boondang, South Korea
  • Volume
    39
  • Issue
    6
  • fYear
    2003
  • Firstpage
    3604
  • Lastpage
    3606
  • Abstract
    Magnetic particle inspection (MPI) is widely used for nondestructive evaluation in aerospace applications in which interpretation of inspection results is currently limited to empirical knowledge and experience-based approaches. Advances in computational magnetics, particularly the use of finite-element calculations, have enabled realistic numerical simulations of magnetic particle inspection to be undertaken with complicated geometries. In this paper, we report a sensitivity analysis using finite-element-method simulations of magnetic particle inspection for defects with various sizes and geometries. As a result, improved quantitative understanding of the MPI technique and factors that affects its sensitivity and reliability has been achieved. These results can be used to optimize conditions for conducting these inspections and should lead to improvement in analysis and interpretation of experimental results.
  • Keywords
    Maxwell equations; finite element analysis; inspection; magnetic flux; magnetic forces; magnetic particles; nondestructive testing; sensitivity analysis; Maxwell´s equations; defect geometry; finite-element calculations; magnetic field gradient; magnetic flux density; magnetic flux leakage; magnetic force; magnetic particle inspection; magnetic powder particles; nondestructive evaluation; sensitivity analysis; Analytical models; Computational geometry; Computational modeling; Finite element methods; Inspection; Magnetic analysis; Magnetic particles; Numerical simulation; Sensitivity analysis; Solid modeling;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2003.816152
  • Filename
    1252842