Title :
Critical role of primitive polynomials in an LFSR based testing technique
Author :
Ahmad, Ayaz ; Nanda, N.K. ; Garg, Kumkum
Author_Institution :
Dept. of Electron. & Comput. Eng., Roorkee Univ.
fDate :
7/21/1988 12:00:00 AM
Abstract :
The results of a simulation of a linear feedback shift register (LFSR) based testing technique show that when the characteristic polynomials used in the test pattern generator, as well as in the signature analyser, are primitive and reciprocal to each other then maximum aliasing errors occur
Keywords :
logic design; logic testing; polynomials; sequential circuits; shift registers; aliasing errors; characteristic polynomials; linear feedback shift register; primitive polynomials; sequential logic design; signature analyser; simulation; test pattern generator; testing technique;
Journal_Title :
Electronics Letters
