Title :
Analysis of MMICs with finite strip thickness and conductivity
Author :
Tedjini, Smail ; Rauly, D. ; Pic, E.
Author_Institution :
LEMO, Grenoble
fDate :
7/21/1988 12:00:00 AM
Abstract :
The spectral domain technique (SDT) is extended to take into account both finite thickness and conductivity of strips in planar monolithic integrated transmission lines. The proposed extension subdivides a strip into elementary thin strips, and preserves the efficiency and versatility of the classical SDT
Keywords :
microwave integrated circuits; monolithic integrated circuits; skin effect; spectral analysis; strip line components; MMICs; SDT; elementary thin strips; finite conductivity; finite strip thickness; monolithic microwave IC; planar monolithic integrated transmission lines; spectral domain technique;
Journal_Title :
Electronics Letters
