Title :
Rotor-Bar Breakage Mechanism and Prognosis in an Induction Motor
Author :
Climente-Alarcon, Vicente ; Antonino-Daviu, Jose Alfonso ; Strangas, Elias G. ; Riera-Guasp, Martin
Author_Institution :
Dept. of Electr. Eng. & Autom., Aalto Univ., Aalto, Finland
Abstract :
This paper proposes a condition-based maintenance and prognostics and health management (CBM/PHM) procedure for a rotor bar in an induction motor. The methodology is based on the results of a fatigue test intended to reproduce in the most natural way a bar breakage in order to carry out a comparison between transient and stationary diagnosis methods for incipient fault detection. Newly developed techniques in stator-current transient analysis have allowed tracking the developing fault during the last part of the test, identifying the failure mechanism, and establishing a physical model of the process. This nonlinear failure model is integrated in a particle filtering algorithm to diagnose the defect at an early stage and predict the remaining useful life of the bar. An initial generalization of the results to conditions differing from the ones under which the fatigue test was developed is studied.
Keywords :
bars; condition monitoring; failure analysis; fatigue testing; fault diagnosis; fracture; induction motors; remaining life assessment; rotors; bar breakage; condition-based maintenance; condition-based prognostics; failure mechanism; fatigue test; health management; incipient fault detection; induction motor; nonlinear failure model; particle filtering algorithm; remaining useful life; rotor-bar breakage mechanism; rotor-bar breakage prognosis; stationary diagnosis methods; transient diagnosis methods; Fatigue; Harmonic analysis; Induction motors; Prognostics and health management; Rotors; Stators; Transient analysis; Failure analysis; fatigue; fault diagnosis; frequency-domain analysis; induction motors; particle filters; prognostics and health management (PHM); remaining life assessment; rotors; spectrogram;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2014.2336604