Title :
Development of textured Au Layer on Ni substrate for YBCO coated conductors
Author :
Lim, Jun Hyung ; Kim, Jung Ho ; Jang, Seok Hern ; Kim, Kyu Tae ; Lee, Jin Sung ; Joo, Jinho ; Kim, Chan-Joong ; Ha, Hong-Soo ; Park, Chan
Author_Institution :
Sch. of Metall. & Mater. Eng., Sungkyunkwan Univ., Gyeonggi, South Korea
fDate :
6/1/2005 12:00:00 AM
Abstract :
Much effort has been made to develop new metallic buffers to explore the possibility of designing YBCO coated conductors (CC´s) with a simple architecture. We selected Au because of its small lattice mismatch to Ni and chemical novelty, and plated it on a biaxially textured Ni substrate by the electroless-plating method. The texture of Au/Ni template was evaluated by X-ray pole-figure and orientation distribution function (ODF) analysis. The surface roughness and grain boundary morphology were characterized by atomic force microscopy (AFM). We fabricated the cube textured Au/Ni template for the CC and evaluated its texture formation and microstructural evolution. Texture analysis indicated that the Au layer was epitaxially deposited on the Ni substrate and formed a strong cube texture when the processing variables were optimized. The full-width at half-maximum (FWHM) was 8.4° for out-of-plane and 9.98° for in-plane texture when the plating time was 30 min. In addition, the root-mean-square (RMS) and the depth of the grain boundary for the Au layer were 14.6 nm and 160 Å, respectively, which are significantly smaller than the corresponding values for the Ni substrate (27.0 nm and 800 Å), indicating that the electroless-plated Au layer had a relatively smooth surface and effectively mollified grain grooves.
Keywords :
barium compounds; electroless deposition; epitaxial growth; gold; grain boundaries; high-temperature superconductors; nickel; texture; yttrium compounds; Au; X-ray pole figure; YBCO coated conductor; YBa2Cu3O7; atomic force microscopy; chemical novelty; cube texture; electroless-plating method; full-width at half-maximum; grain boundary morphology; in-plane texture; lattice mismatch; metallic buffer; microstructural evolution; orientation distribution function; plating time; root-mean-square; surface roughness; texture analysis; textured Au layer; Atomic force microscopy; Chemicals; Conductors; Distribution functions; Gold; Grain boundaries; Lattices; Substrates; Surface morphology; Yttrium barium copper oxide; Electroless-plating; YBCO coated conductors; substrate; texture;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2005.847775