DocumentCode
840803
Title
A MEMS Inertia Switch With Bridge-Type Elastic Fixed Electrode for Long Duration Contact
Author
Yang, Zhuoqing ; Ding, Guifu ; Cai, Haogang ; Zhao, Xiaolin
Author_Institution
Res. Inst. of Micro/Nanometer Sci. & Technol., Shanghai Jiao Tong Univ., Shanghai
Volume
55
Issue
9
fYear
2008
Firstpage
2492
Lastpage
2497
Abstract
A multilayer structural inertia microswitch with a bridge-type elastic fixed electrode for long duration contact has been designed and fabricated based on surface micromachining technology. The microswitch mainly consists of a suspended thick proof mass as a movable electrode and two parallel elastic beams with holes as a fixed electrode. The proof mass is designed to be much thicker than attached snake spring section. As a new type of fixed electrode, the bridge-type elastic beams can effectively improve the contact of the microswitch. The packaged microswitch (3.2 times 2.1 times1.3 mm3) has been tested and characterized by a dropping hammer system. The response time and the contact time of the microswitch are about 0.25 ms and 12 mus, respectively, when 100 g acceleration is applied, which indicates a better contact effect than current reported switches. Dependence of the contact time on the thickness of the parallel beam under applied acceleration of 100 g has been discussed. The contact time increases as the thickness of the parallel elastic beam decreases. The test data have an agreement with dynamic finite element simulation results.
Keywords
finite element analysis; mechanical contact; microelectrodes; micromechanical devices; microswitches; MEMS inertia switch; bridge-type elastic fixed electrode; contact effect; dropping hammer system; dynamic finite element simulation; multilayer structural inertia microswitch; parallel elastic beam; surface micromachining technology; time 0.25 ms; time 12 mus; Acceleration; Contacts; Electrodes; Micromachining; Micromechanical devices; Microswitches; Nonhomogeneous media; Packaging; Springs; Switches; Contact dynamics simulation; dropping test; inertia switch; microelectromechanical system (MEMS); surface micromachining;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2008.927385
Filename
4603184
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